Characteristics of Au/PbZr0.52Ti0.48O3/YBa2Cu3O7−δ capacitors fabricated on LaAlO3 and Y2O3-stabilized ZrO2 substrates during irradiation-Reference-Cited by-同舟云学术

Characteristics of Au/PbZr0.52Ti0.48O3/YBa2Cu3O7−δ capacitors fabricated on LaAlO3 and Y2O3-stabilized ZrO2 substrates during irradiation

Published:1999-06 Issue:6 Volume:79 Page:829-838
ISSN:1364-2812
Container-title:Philosophical Magazine B
language:en
Short-container-title:Philosophical Magazine B

Author:

Gao Jianxia¹²,Zheng Lirong¹,Song Zhitang¹,Wang Lianwei¹,Yang Lixin¹,Zhu Dezhang²,Lin Chenglu²

Affiliation:

1. a State Key Laboratory of Functional Materials for Informatics , Shanghai institute of Metallurgy, Chinese Academy of Sciences , Shanghai , 200050 , PR China

2. b Shanghai Institute of Nuclear Research, Chinese Academy of Sciences , Shanghai , 201800 , PR China

Publisher

Informa UK Limited

Subject

General Physics and Astronomy,General Chemical Engineering

Link

https://www.tandfonline.com/doi/pdf/10.1080/13642819908214843

Reference27 articles.

1. dc Electrical Degradation of Perovskite-Type Titanates: III, A Model of the Mechanism

2. Radiation evaluation of commercial ferroelectric nonvolatile memories

3. The effect of ionizing radiation on sol-gel ferroelectric PZT capacitors

4. Investigation of Pt Bottom Electrodes for "In-Situ" Deposited Pb(Zr,Ti)O3 (PZT) thin Films

5. A study of radiation vulnerability of ferroelectric material and devices

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