Total Ionizing Dose Effects on Piezoelectric Thin-Film Cantilevers With Oxide Electrodes-Reference-Cited by-同舟云学术

Total Ionizing Dose Effects on Piezoelectric Thin-Film Cantilevers With Oxide Electrodes

Published:2017-07 Issue:7 Volume:64 Page:1135-1143
ISSN:0885-3010
Container-title:IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
language:
Short-container-title:IEEE Trans. Ultrason., Ferroelect., Freq. Contr.

Author:

Rudy Ryan Q.^ORCID,Grove Kyle M.,Rivas Manuel,Guerrier Jonathon,Cress Cory,Benoit Robert R.,Jones Jacob L.,Glaser Evan,Brewer Steven,Bassiri-Gharb Nazanin,Polcawich Ronald G.

Funder

Defense Threat Reduction Agency, Basic Research, to Georgia Institute of Technology

Analytical Instrumentation Facility (AIF) at North Carolina State University

State of North Carolina and the National Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Acoustics and Ultrasonics,Instrumentation

Link

http://ieeexplore.ieee.org/ielaam/58/7974830/7974872-aam.pdf

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