Low-temperature crystallization and ferroelectric properties of sol-gel derived layer-structured perovskite thin films-Reference-Cited by-同舟云学术

Low-temperature crystallization and ferroelectric properties of sol-gel derived layer-structured perovskite thin films

Published:1997-09 Issue:1-4 Volume:18 Page:237-247
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Kato Kazumi¹,Finder Jeffrey Michael¹,Dey Sandwip Kumar¹,Torii Yasuyoshi²

Affiliation:

1. a Arizona State University , Tempe, AZ, 85287-6006

2. b National Industrial Research Institute of Nagoya , 1 Hirate-cho, Kita-ku, Nagoya, 462, Japan

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584589708221702

Reference13 articles.

1. Fatigue-free ferroelectric capacitors with platinum electrodes

2. Preparation of Bi-Based Ferroelectric Thin Films by Sol-Gel Method

3. Analysis of the Dependence of Ferroelectric Properties of Strontium Bismuth Tantalate (SBT) Thin Films on the Composition and Process Temperature

4. New Low Temperature Processing of Sol-GelSrBi2Ta2O9Thin Films

5. Chemical Processing and Dielectric Properties of FerroelectricSrBi2Ta2O9Thin Films

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