Curie - Von Schweidler behaviour observed in ferroelectric thin films and comparison to superparaelectric thin film materials-Reference-Cited by-同舟云学术

Curie - Von Schweidler behaviour observed in ferroelectric thin films and comparison to superparaelectric thin film materials

Published:1998-03 Issue:1-4 Volume:22 Page:109-121
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Schumacher M.¹,Waser R.²

Affiliation:

1. a AIXTRON AG , Kackertstr. 15–17, 52072 , Aachen , Germany

2. b Institut für Werkstoffe der Elektrotechnik (IWE), RWTH Aachen University of Technology , Germany

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584589808208034

Reference27 articles.

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2. Dielectric relaxation of perovskite—type oxide thin films

3. The dielectric response as a function of temperature and film thickness of fiber-textured (Ba,Sr)TiO3 thin films grown by chemical vapor deposition

4. Dielectric Relaxation of(Ba,Sr)TiO3Thin Films

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