Estimation of steady-state leakage current in polycrystalline PZT thin films
Author:
Affiliation:
1. Moscow Technological University (MIREA), Vernadsky pr. 78, 119454 Moscow, Russia
Funder
Russian Foundation for Basic Research (RFBR)
Ministry of Education and Science of the Russian Federation
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4964147
Reference27 articles.
1. Ferroelectric thin films: Review of materials, properties, and applications
2. Applications of Modern Ferroelectrics
3. Electrical characterization of PbZr[sub 0.4]Ti[sub 0.6]O[sub 3] capacitors
4. Leakage currents in Ba0.7Sr0.3TiO3 thin films for ultrahigh-density dynamic random access memories
5. Leakage currents in ferroelectric thin films
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