Measurement and calculation of PZT thin film longitudinal piezoelectric coefficients-Reference-Cited by-同舟云学术

Measurement and calculation of PZT thin film longitudinal piezoelectric coefficients

Published:1999-08 Issue:1-4 Volume:24 Page:139-146
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Maiwa H.¹,Maria J-P.¹,Christman J. A.²,Kim S-H.¹,Streiffer S. K.³,Kingon A. I.¹

Affiliation:

1. a Department Of Materials Science and Engineering , North Carolina State University , Raleigh, NC, 27695

2. b Department of Physics , North Carolina State University , Raleigh, NC, 27695

3. c Materials Science Division , Argonne National Laboratory , Argonne, IL, 60439

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584589908215586

Reference11 articles.

1. Interferometric measurements of electric field‐induced displacements in piezoelectric thin films

2. Relationships between Ferroelectric 90° Domain Formation and Electrical Properties of Chemically Prepared Pb(Zr,Ti)O3 Thin Films

3. Effect of poling on piezoelectric properties of lead zirconate titanate thin films formed by sputtering

4. Electrical properties’ maxima in thin films of the lead zirconate–lead titanate solid solution system

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