Surface characterisation of strontium-bismuth tantalate (SBT) thin films-Reference-Cited by-同舟云学术

Surface characterisation of strontium-bismuth tantalate (SBT) thin films

Published:1999-07 Issue:1-4 Volume:23 Page:113-126
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Hartmann A. J.¹,Lamb R. N.¹,Scott J. F.²,Johnston P. N.³,Bouanani M. E.³,Chen C. W.⁴,Robertson J.⁴

Affiliation:

1. a Surface Science and Technology, University of New South Wales , Sydney, 2052, Australia

2. b School of Physics, University of New South Wales , Sydney, 2052, Australia

3. c Dept. of Applied Physics , RMIT , Melbourne, 3001, Australia

4. d Engineering Dept. , Cambridge University , Cambridge, CB2 1PZ, UK

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584589908210144

Reference41 articles.

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2. Foran , G. J. Cookson , D. J. and Garrett , R. F. 1994.Synchrotron Radiation Facilities in Asia, Edited by: Ohta , T. Suga , S. and Kikuta , S. pp. 119–124. Tokyo: Ionics Pub. Co.

3. A semiautomatic algorithm for rutherford backscattering analysis

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