LIMM: A technique for determination of the spatial distribution of the spontaneous polarization in ferroelectric thin films-Reference-Cited by-同舟云学术

LIMM: A technique for determination of the spatial distribution of the spontaneous polarization in ferroelectric thin films

Published:1999-11 Issue:1-4 Volume:27 Page:119-126
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Lang Sidney B.¹

Affiliation:

1. a Department of Chemical Engineering , Ben-Gurion University of the Negev , Beer Sheva, Israel

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584589908228461

Reference12 articles.

1. NANO-phase SBT-family ferroelectric memories

2. Characterisation of the fatigued state of ferroelectric PZT thin-film capacitors

3. Nanoscale investigation of fatigue effects in Pb(Zr,Ti)O3 films

4. Scanning force microscopy: Application to nanoscale studies of ferroelectric domains

5. Microscopic observation of “region by region” polarisation domains freezing during fatigue of the Pt-PZT-Pt system

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4. Determination of the polarization distribution in a weakly-poled PVDF film using the surface laser intensity modulation method (SLIMM);Materials Chemistry and Physics;2003-04

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