Scanning force microscopy: Application to nanoscale studies of ferroelectric domains

Author:

Gruverman Alexei12,Auciello Orlando3,Tokumoto Hiroshi4

Affiliation:

1. a Joint Research Center for Atom Technology — Angstrom Technology Partnership (JRCAT-ATP) , Higashi 1-1-4, Tsukuba, Ibaraki, 305, Japan

2. d E-mail:

3. b Argonne National Laboratory, Materials Science Division , 9700 South Cass Av., Argonne, IL, 60439-4838

4. c JRCAT, National Institute for Advanced Interdisciplinary Research , Higashi 1-1-4, Tsukuba, Ibaraki, 305, Japan

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

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