Scanning force microscopy: Application to nanoscale studies of ferroelectric domains-Reference-Cited by-同舟云学术

Scanning force microscopy: Application to nanoscale studies of ferroelectric domains

Published:1998-04 Issue:1-4 Volume:19 Page:49-83
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Gruverman Alexei¹²,Auciello Orlando³,Tokumoto Hiroshi⁴

Affiliation:

1. a Joint Research Center for Atom Technology — Angstrom Technology Partnership (JRCAT-ATP) , Higashi 1-1-4, Tsukuba, Ibaraki, 305, Japan

2. d E-mail:

3. b Argonne National Laboratory, Materials Science Division , 9700 South Cass Av., Argonne, IL, 60439-4838

4. c JRCAT, National Institute for Advanced Interdisciplinary Research , Higashi 1-1-4, Tsukuba, Ibaraki, 305, Japan

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584589808012695

Reference55 articles.

1. Atomic Force Microscope

2. Wiesendanger , R. 1994. Scanning Probe Microscopy and Spectroscopy: Methods and Applications, 291Cambridge: University Press.

3. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

4. Imaging of ferroelectric domain walls by force microscopy

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