A comprehensive review of microwave system requirements on thin-film ferroelectrics-Reference-Cited by-同舟云学术

A comprehensive review of microwave system requirements on thin-film ferroelectrics

Published:1999-08 Issue:1-4 Volume:24 Page:215-237
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Korn David S.¹²,Wu Huey-Daw³²

Affiliation:

1. a TASC Inc. , 4801 Stonecroft Blvd, Chantilly, VA, 20151, USA

2. c Naval Research Laboratory , Washington, D.C., 20375, USA

3. b SFA Inc. , 1401 McCormick Drive, Largo, MD, 20774, USA

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584589908215593

Reference23 articles.

1. Structure/property relationships in ferroelectric thin films for frequency agile microwave electronics

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