Gap-state distribution in a-Si:H by modulated photocurrent: Shallow-state-deep-state conversion and temperature shift of the electron-transport path
Author:
Affiliation:
1. a Institut für physikalische Elektronik , Universität Stuttgart Pfaffenwaldring 47, D-7000 Stuttgart 80, F.R. , Germany
2. b Instytut Technologii Elektronowej, Politechniki Wroclawskiej , Wybrzeze Wyspianskiego 27, 50-370 , Wroclaw , Poland
Publisher
Informa UK Limited
Subject
General Physics and Astronomy,General Chemical Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/13642818808218383
Reference18 articles.
1. DEFECTS IN AMORPHOUS CHALCOGENIDES AND SILICON
2. Chapter 2 Density of States from Junction Measurements in Hydrogenated Amorphous Silicon
3. Defect states in amorphous silicon
4. Activated transport in amorphous semiconductors. II. Interpretation of experimental data
5. Doctoral Thesis;Jonscher A. K.,1983
Cited by 19 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. The role of the recombination centers on the modulated photocurrent: Determination of the gap state parameters of semiconductors;Philosophical Magazine;2010-09-07
2. Trapping effects on the frequency response of dithiolene-based planar photodetectors;Synthetic Metals;2007-11
3. Light-induced changes in the gap states above midgap of hydrogenated amorphous silicon;Journal of Applied Physics;2005-01-15
4. Influence of light-soaking and annealing on electron and hole mobility–lifetime products in a-Si:H;Journal of Non-Crystalline Solids;2004-06
5. Fingerprints of two distinct defects causing light-induced photoconductivity degradation in hydrogenated amorphous silicon;Applied Physics Letters;2001-11-05
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3