Electrical noise measurements in intrinsic amorphous silicon
Author:
Affiliation:
1. a Department of Electrical Engineering , Imperial College , London , SW7 2BT , England
Publisher
Informa UK Limited
Subject
General Physics and Astronomy,General Chemical Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/13642818708211259
Reference11 articles.
1. Noise spectroscopy in amorphous silicon films
2. Drazin , J. V. P. 1984. London University. Ph.D. Thesis
3. Experimental studies on 1/f noise
4. Determination of the extended-state electron mobility in a-Si
5. Conduction in non-crystalline materials
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