Quantification of dislocation structures at high resolution by atomic force microscopy of dislocation etch pits
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics
Link
http://www.tandfonline.com/doi/pdf/10.1080/09500830902984554
Reference16 articles.
1. Die Spannungsabhängigkeit der Versetzungsdichte reiner und Mg-dotierter LiF-Einkristalle
2. Evolution of dislocation structure and deformation resistance in creep exemplified on single crystals of CaF2
3. Quantifying the distributions of dislocation spacings and cell sizes
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2. Defect-Related Etch Pits on Crystals and Their Utilization;Crystals;2022-10-30
3. Influence of dislocation density on the pop-in behavior and indentation size effect in CaF2 single crystals: Experiments and molecular dynamics simulations;Acta Materialia;2011-06
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