Experimental aspects of the constant photocurrent method applied to a-Si: H
Author:
Affiliation:
1. a Department of Physics , PdF Masaryk University Brno , Porici 7, 60300 , Brno , Czech Republic
2. b Laboratoire d'Optique des Solides, URA CNRS 781, Université P. et M. Curie, Case 80 , 4 place Jussieu, 75252 , Paris Cédex 05 , France
Publisher
Informa UK Limited
Subject
General Physics and Astronomy,General Chemical Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/01418639508243592
Reference14 articles.
1. Determination of low absorption coefficients from absorptance measurements on thin films
2. Light scattering effects in CPM and PDS measurement on a-Si:H films
3. Systematic study of the influence of contacts on CPM results
4. Kocka , J. Vanecek , M. and Triska , A. 1988.Amorphous Silicon and Related materials, Edited by: Fritzsche , H. 297Singapore: World Scientific. edited by, p.
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