Role of residual stress on phase transformations of Pb(Zr0.50Ti0.50)O3thin films obtained from chemical route
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://www.tandfonline.com/doi/pdf/10.1080/00150193.2016.1171651
Reference18 articles.
1. Processing Technologies for High-Permittivity Thin Films in Capacitor Applications
2. Chemical solution deposition of electronic oxide films
3. X-ray diffraction measurement of residual stress in PZT thin films prepared by pulsed laser deposition
4. Studies on ferroelectric perovskites and Bi-layered compounds using micro-Raman spectroscopy
5. Determination of residual stresses in Pb(Zr0.53Ti0.47)O3 thin films with Raman spectroscopy
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1. Optimization of the production process of BZT–BCT sol–gel thin films obtained from a highly stable and green precursor solution;Materials and Manufacturing Processes;2021-05-17
2. Improvement of Ferroelectrics Properties of Lead-Free Thin Films by Sol Gel Process Optimization;Lecture Notes in Electrical Engineering;2021
3. On the influence of pyrochlore phase on ferroelectric and dielectric properties of PZT thin films;Ferroelectrics;2020-02-17
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