Microstructure and Dielectric Properties of Bismuth Copper Tantalate as Internal Barrier Layer Capacitor Ceramic
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://www.tandfonline.com/doi/pdf/10.1080/00150193.2013.821384
Reference14 articles.
1. High Dielectric Constant in ACu3Ti4O12 and ACu3Ti3FeO12 Phases
2. CaCu3Ti4O12: One-step internal barrier layer capacitor
3. Colossal dielectric constants in single-crystalline and ceramic CaCu3Ti4O12 investigated by broadband dielectric spectroscopy
4. Dielectric and non-Ohmic properties of CaCu3Ti4O12 ceramics modified with NiO, SnO2, SiO2, and Al2O3 additives
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1. Enhancement of dielectric response by the interaction of point defect and grain boundary in copper tantalate oxides;Ceramics International;2021-06
2. Multilayer capacitors with bismuth copper tantalate dielectric fabricated in LTCC technology;Microelectronics International;2016-08-01
3. Study on dielectric properties of lanthanum copper tantalate ceramics by impedance spectroscopy;Materials Science in Semiconductor Processing;2015-10
4. Dielectric properties of high-permittivity A2/3CuTa4O12 ceramics;Microelectronics International;2014-08-04
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