Characterization of Pt/BiFeO3/ZrO2/Si Capacitors for Memory Applications
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://www.tandfonline.com/doi/pdf/10.1080/00150193.2010.483379
Reference14 articles.
1. High-resolution x-ray diffraction and transmission electron microscopy of multiferroic BiFeO[sub 3] films
2. Micro-structure and ferroelectric properties of BiFeO3 thin films formed on Pt-coated r-plane sapphire substrates
3. Multiferroic and magnetoelectric materials
4. Revival of the magnetoelectric effect
5. Epitaxial BiFeO 3 Multiferroic Thin Film Heterostructures
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