Ontogenetic-based sequential path analysis of grain yield and its related traits in several winter wheat cultivars-Reference-Cited by-同舟云学术

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Ontogenetic-based sequential path analysis of grain yield and its related traits in several winter wheat cultivars

Published:2015-05-29 Issue:7 Volume:65 Page:605-618
ISSN:0906-4710
Container-title:Acta Agriculturae Scandinavica, Section B — Soil & Plant Science
language:en
Short-container-title:Acta Agriculturae Scandinavica, Section B — Soil & Plant Science

Author:

Mądry Wiesław,Studnicki Marcin,Rozbicki Jan,Golba Jan,Gozdowski Dariusz,Pecio Alicja,Oleksy Andrzej

Funder

Polish Ministry of Science and Higher Education

Publisher

Informa UK Limited

Subject

Soil Science,Agronomy and Crop Science

Link

http://www.tandfonline.com/doi/pdf/10.1080/09064710.2015.1039053

Reference45 articles.

1. Influence of Planting Date, Seeding Rate, and Phosphorus Rate on Wheat Yield

2. Path Analyses of the Yield Formation Process for Late‐Planted Soybean

3. Evaluation of 14 morphological, yield-related and physiological traits as indicators of drought tolerance in Chinese winter bread wheat revealed by analysis of the membership function value of drought tolerance (MFVD)

4. Analysis of Genotype-by-Environment Interaction in Wheat Using a Structural Equation Model and Chromosome Substitution Lines

5. Ontogenetic Evaluation of Grain Yield and Time to Maturity in Barley

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