A γ-ray and small-angle neutron scattering study of oxygen precipitation in silicon single crystals
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics
Link
http://www.tandfonline.com/doi/pdf/10.1080/09500838808214751
Reference14 articles.
1. Diffusion limited precipitation of oxygen in dislocation‐free silicon
2. Diffuse Scattering from Defect Clusters near Bragg Reflections
3. Freund, A. 1973. Dissertation: Technische Universität München.
4. A Comparison of Diffuse Scattering by Defects Measured in Anomalous Transmission and Near Bragg Reflections
5. An infrared and neutron scattering analysis of the precipitation of oxygen in dislocation-free silicon
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Chapter 3 Characterization Techniques for Oxygen in Silicon;Semiconductors and Semimetals;1994
2. Microscopic aspects of oxygen precipitation in silicon;Materials Science and Engineering: B;1989-10
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