Heavy ion elastic recoil detection analysis set up for electronic sputtering studies-Reference-Cited by-同舟云学术

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Heavy ion elastic recoil detection analysis set up for electronic sputtering studies

Published:2006-04 Issue:4 Volume:161 Page:247-255
ISSN:1042-0150
Container-title:Radiation Effects and Defects in Solids
language:en
Short-container-title:Radiation Effects and Defects in Solids

Author:

Ghosh S.,Avasthi D. K.,Tripathi A.,Kabiraj D.,Sugathan P.,Chaudhary G. K.,Barua P.

Publisher

Informa UK Limited

Subject

Condensed Matter Physics,General Materials Science,Nuclear and High Energy Physics,Radiation

Link

http://www.tandfonline.com/doi/pdf/10.1080/10420150600668564

Reference22 articles.

1. L'Ecuyer, J. and Brassard, C. and Cardinal, C. and (1976) J. Appl. Phys., 47, pp. 381.

2. Doyle, B. and Peercy, P. (1979) Appl. Phys. Lett., 34, pp. 11.

3. Adrian, H. and Ischenko, G. and Lehmann, M. and (1978) J. Less-Common Metals, 62, pp. 99.

4. Conlon, T. (1985) Nucl. Instrum. Meth. B, 9, pp. 311.

5. Thomas, J. and Fallavier, M. and Ziani, A. (1986) Nucl. Instrum. Meth. B, 15, pp. 443.

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Implementation of heavy-ion elastic recoil detection analysis at JANNUS-Saclay for quantitative helium depth profiling;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-10

2. Band gap controlled H loss from passivated Hg1−xCdxTe (MCT) wafers under intense electronic excitations;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-05

3. Study of H loss from hydrogenated Hg1−xCdxTe under high electronic excitation by elastic recoil detection analysis (ERDA);Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2009-05

4. Preparation of Fullerene (C60) Based SiO2 Sonogel Hybrid Composites: UV Laser Induced Photo-Polymerization, Morphological, and Optical Properties;Journal of Nanoscience and Nanotechnology;2008-07-01

5. Size effect on electronic sputtering of LiF thin films;Journal of Applied Physics;2007-10-15

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