Study of H loss from hydrogenated Hg1−xCdxTe under high electronic excitation by elastic recoil detection analysis (ERDA)-Reference-Cited by-同舟云学术

Study of H loss from hydrogenated Hg1−xCdxTe under high electronic excitation by elastic recoil detection analysis (ERDA)

Published:2009-05 Issue:10 Volume:267 Page:1797-1799
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Anjali ,Ghosh S.,Khan S.A.,Srivastava P.,Pal R.,Pathak A.P.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference24 articles.

1. Physics of Semiconductor Devices;Gupta,2000

2. Semiconductors and Semimetals;Willardson,1984

3. Infrared Photon Detectors;Rogalski,1995

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