Spectrum adapted expectation-conditional maximization algorithm for extending high–throughput peak separation method in XPS analysis-Reference-Cited by-同舟云学术

Spectrum adapted expectation-conditional maximization algorithm for extending high–throughput peak separation method in XPS analysis

Published:2021-01-01 Issue:1 Volume:1 Page:45-55
ISSN:2766-0400
Container-title:Science and Technology of Advanced Materials: Methods
language:en
Short-container-title:Science and Technology of Advanced Materials: Methods

Author:

Matsumura Tarojiro¹^ORCID,Nagamura Naoka²³^ORCID,Akaho Shotaro⁴^ORCID,Nagata Kenji²³^ORCID,Ando Yasunobu¹^ORCID

Affiliation:

1. Research Center for Computational Design of Advanced Functional Materials (CD-FMat), National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan

2. Research Center for Advanced Measurement and Characterization, National Institute for Materials Science (NIMS), Tsukuba, Japan

3. Japan Science and Technology Agency, PRESTO, Honcho, Kawaguchi, Japan

4. Artificial Intelligence Research Center (AIRC), National Institute of Advanced Industrial Science and Technology, Tokyo, Japan

Funder

New Energy and Industrial Technology Development Organization

Publisher

Informa UK Limited

Link

https://www.tandfonline.com/doi/pdf/10.1080/27660400.2021.1899449

Reference37 articles.

1. Very High Resolution Photoelectron Spectroscopy

2. Photoelectron Spectroscopy

3. Bayesian spectral deconvolution with the exchange Monte Carlo method

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Maximum a posteriori estimation for high-throughput peak fitting in X-ray photoelectron spectroscopy;Science and Technology of Advanced Materials: Methods;2024-08-07

2. Appropriate Basis Selection Based on Bayesian Inference for Analyzing Measured Data Reflecting Photoelectron Wave Interference;Journal of the Physical Society of Japan;2024-07-15

3. High-Throughput Calibration-Free Laser-Induced Breakdown Spectroscopy;ACS Earth and Space Chemistry;2024-06-03

4. High-throughput XPS spectrum modeling with autonomous background subtraction for 3 d _5/2 peak mapping of SnS;Science and Technology of Advanced Materials: Methods;2023-01-24

5. A Novel Unresolved Peaks Analysis Algorithm for ME Signal Detection Based on Improved SMA;IEEE Transactions on Instrumentation and Measurement;2023