Total reflection X‐ray fluorescence (TXRF) for direct analysis of aerosol particle samples-Reference-Cited by-同舟云学术

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Total reflection X‐ray fluorescence (TXRF) for direct analysis of aerosol particle samples

Published:2010-04-14 Issue:5 Volume:31 Page:467-477
ISSN:0959-3330
Container-title:Environmental Technology
language:en
Short-container-title:Environmental Technology

Author:

Bontempi E.,Zacco A.,Benedetti D.,Borgese L.,Colombi P.,Stosnach H.,Finzi G.,Apostoli P.,Buttini P.,Depero L.E.

Publisher

Informa UK Limited

Subject

Waste Management and Disposal,Water Science and Technology,General Medicine,Environmental Chemistry

Link

http://www.tandfonline.com/doi/pdf/10.1080/09593330903513260

Reference39 articles.

1. Particulate Air Pollution as a Predictor of Mortality in a Prospective Study of U.S. Adults

2. Personal exposure to elements in Mexico City air

3. Metals in Particulate Pollutants Affect Peak Expiratory Flow of Schoolchildren

4. Source apportionment of urban ambient PM2.5 in two successive measurement campaigns in Helsinki, Finland

5. Elemental analysis by PIXE and other IBA techniques and their application to source fingerprinting of atmospheric fine particle pollution

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