3-D finite element calculation of electric field enhancement for nanostructures fabrication mechanism on silicon surface with AFM tip induced local anodic oxidation-Reference-Cited by-同舟云学术

3-D finite element calculation of electric field enhancement for nanostructures fabrication mechanism on silicon surface with AFM tip induced local anodic oxidation

Published:2018-06-13 Issue:1 Volume:190 Page:129-141
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Theogene Barayavuga¹²,Cui Jianlei¹²³⁴,Wang Xuewen¹,Wang Wenjun¹,Mei Xuesong¹,Yi Peiyun²,Yang Xinju³,He Xiaoqiao⁴⁵,Xie Hui⁶

Affiliation:

1. State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an, P. R. China

2. State Key Laboratory of Mechanical System and Vibration, Shanghai Jiao Tong University, Shanghai, P. R. China

3. State Key Laboratory of Surface Physics and Department of Physics, Fudan University, Shanghai, P. R. China

4. Department of Architecture and Civil Engineering, City University of Hong Kong, Kowloon, Hong Kong

5. Center for Advanced Structural Materials, City University of Hong Kong Shenzhen Research Institute, Shenzhen, P. R. China

6. State Key Laboratory of Robotics and Systems, Harbin Institute of Technology, Harbin, P. R. China

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584587.2018.1457346

Reference41 articles.

1. Nanospot Soldering Polystyrene Nanoparticles with an Optical Fiber Probe Laser Irradiating a Metallic AFM Probe Based on the Near-Field Enhancement Effect

2. Nanoscale Soldering of Axially Positioned Single-Walled Carbon Nanotubes: A Molecular Dynamics Simulation Study

3. Fabrication of nanopatterns on H-passivated Si surface by AFM local anodic oxidation

4. Nanospot welding of carbon nanotubes using near-field enhancement effect of AFM probe irradiated by optical fiber probe laser

5. Investigating interfacial contact configuration and behavior of single-walled carbon nanotube-based nanodevice with atomistic simulations

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