Studies on orientation dependence of dechanneling using rutherford backscattering and characteristic X-ray yields-Reference-Cited by-同舟云学术

Studies on orientation dependence of dechanneling using rutherford backscattering and characteristic X-ray yields

Published:1983-01 Issue:3-4 Volume:77 Page:205-215
ISSN:0033-7579
Container-title:Radiation Effects
language:en
Short-container-title:Radiation Effects

Author:

Kosse A. I.,Neshov F. G.,Pusanov A. A.,Urmanov A. R.,Burenkov A. F.,Komarov F. F.

Publisher

Informa UK Limited

Subject

General Engineering

Link

http://www.tandfonline.com/doi/pdf/10.1080/00337578308228187

Reference12 articles.

1. Channeling of MeVHe+Ions in Tungsten and Other Crystals: An Intercomparison of Rutherford Scattering and of CharacteristicLandMX-Ray Yields

2. Channeling dips for outer-shell X-ray yields

3. Correlation of predicted and measured GaAs and Ge X-ray yields as a function of crystal orientation

4. X-ray and rutherford backscattering yields from channeled helium ions in GaAs

5. Kosse, A. I., Neshov, F. G. and Pusanov, A. A. 1981. Proceedings of Tenth All-Union Conference on Physics of Interaction of Charged Particles and Crystals, M., MGU. 1981. pp.p. 392

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Polarization of the characteristic X-radiation induced by channeled particle impact;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1987-07

2. Ion-Induced Characteristic X-Ray Emission in Solids;physica status solidi (b);1987-01-01

3. Orientation dependence of intensity ratios for tungsten L X-rays induced by fast channeled ions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1986-03