Arsenic bombardment of PMMA and microposit 23M

Author:

Chereckdjian S.1,Wilson I. H.1

Affiliation:

1. a Department of Electronic and Electrical Engineering , University of Surrey , Guildford, Surrey , GU2 5XH , U.K.

Publisher

Informa UK Limited

Subject

General Engineering

Reference16 articles.

1. Namba , S. Proc. International Ion Eng. Congress–ISIAT, IPAT'83. Kyoto. Edited by: Takagi , T. pp.1533Japan: I.E.E.

2. Ion Implantation Techniques

3. Mural , J. J. Proc. International Ion Eng. Congress–ISIAT, IPAT'83. Kyoto. Edited by: Takagi , T. pp.1545Japan: I.E.E.

4. Molecular stopping powers and effect of chemical bonding in gaseous amine compounds

5. Ion bombardment of resists

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1. Photoresist Removal Using Low Molecular Weight Alcohols;Journal of The Electrochemical Society;2000

2. Ion beam modification of PMMA – changes of the optical properties;Radiation Effects and Defects in Solids;1996-01

3. Focused ion beam metrology;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1995-11

4. Focused Ion Beam Metrology;MRS Proceedings;1995

5. Energetic neutral contamination in modern high-current implanters;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1991-04

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