Learning with supervised data for anomaly detection in smart manufacturing
Author:
Affiliation:
1. Department of AI/IoT DA&I-IT, Rockwell Automation, Inc., Milwaukee, USA
2. University of Wisconsin – Milwaukee, Milwaukee, WI, USA
3. Department of Industrial and Manufacturing Engineering, University of Wisconsin–Milwaukee, Milwaukee, USA
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering,Computer Science Applications,Mechanical Engineering,Aerospace Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/0951192X.2023.2177747
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