Influence of chemical etching on metal contacts to II-VI compounds: CdTe and ZnSe
Author:
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering
Link
http://www.tandfonline.com/doi/pdf/10.1080/00207219408926005
Reference6 articles.
1. Aging effects and Auger depth profiling studies of Sb/n-CdTe contacts
2. Effects of surface treatments on Schottky barrier formation at metal/n‐type CdTe contacts
3. Blue‐green laser diodes
4. p‐type ZnSe by nitrogen atom beam doping during molecular beam epitaxial growth
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1. II–VI Semiconductor-Based Conductometric Gas Sensors: Is There a Future for These Sensors?;Sensors;2024-06-14
2. II-VI Wide-Bandgap Semiconductor Device Technology: Schottky Barrier, Ohmic Contacts, and Heterostructures;Handbook of II-VI Semiconductor-Based Sensors and Radiation Detectors;2023
3. II-VI Wide-Bandgap Semiconductor Device Technology: Deposition, Doping, and Etchig;Handbook of II-VI Semiconductor-Based Sensors and Radiation Detectors;2023
4. Wet-etching characteristics of Ge/sub 2/Sb/sub 2/Te/sub 5/ thin films for phase-change memory;IEEE Transactions on Magnetics;2005-02
5. Electrical properties at p-ZnSe/metal interfaces;Journal of Electronic Materials;1998-08
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