Minimal C-testable tests for block-CLA adders
Author:
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/002072198133897
Reference12 articles.
1. Optimal Testing and Design of Adders
2. On the generation of area-time optimal testable adders
3. Hierarchical Modeling for VLSI Circuit Testing
4. Easily Testable Iterative Systems
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