The nucleation, growth, structure and epitaxy of thin surface films-Reference-Cited by-同舟云学术

The nucleation, growth, structure and epitaxy of thin surface films

Published:1965-07 Issue:55 Volume:14 Page:327-416
ISSN:0001-8732
Container-title:Advances in Physics
language:en
Short-container-title:Advances in Physics

Author:

Pashley D.W.

Publisher

Informa UK Limited

Subject

Condensed Matter Physics

Link

http://www.tandfonline.com/doi/pdf/10.1080/00018736500101071

Reference200 articles.

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3. A Tracer Method for the Thickness Measurement of Thin Bi Films

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