PLA Binaries in the Context of Competency-Based Assessment
Author:
Publisher
Informa UK Limited
Subject
Education
Link
http://www.tandfonline.com/doi/pdf/10.1080/07377363.2014.877769
Reference7 articles.
1. Capturing Tacit Knowledge for Assessing Employees' Competency and Productivity
2. Tacit Knowledge: Revisiting the epistemology of knowledge
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