Dislocations in recrystallized aluminium crystals
Author:
Publisher
Informa UK Limited
Link
http://www.tandfonline.com/doi/pdf/10.1080/14786436408222966
Reference3 articles.
1. A method for the examination of crystal sections using penetrating characteristic X radiation
2. The projection topograph: a new method in X-ray diffraction microradiography
3. Dislocation structures observed in high-purity recrystallized aluminium by X-ray diffraction
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Defect Generation in Metal Crystals;Characterization of Crystal Growth Defects by X-Ray Methods;1980
2. Etude par topographie aux rayons X de la segregation des impuretes dans l'aluminium recristallise;Scripta Metallurgica;1976-03
3. X-Ray Diffraction Microscopy;Microstructural Analysis;1973
4. Application de la topographie par diffraction des rayons X à l'étude des métaux;Revue de Physique Appliquée;1968
5. Comparison of dislocation configurations produced by annealing in air, with those produced by annealing in vacuum, of aluminium crystals;Journal of Crystal Growth;1968-01
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