In situmicro-Raman compression: characterization of plasticity and fracture in GaAs
Author:
Publisher
Informa UK Limited
Subject
Condensed Matter Physics
Link
http://www.tandfonline.com/doi/pdf/10.1080/14786435.2010.495358
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1. Effect of static uniaxial stress on the Raman spectrum of silicon
2. Micro-Raman spectroscopy to study local mechanical stress in silicon integrated circuits
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