Determination of trapping–detrapping events, recombination processes and gap-state parameters by modulated photocurrent measurements on amorphous silicon-Reference-Cited by-同舟云学术

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Determination of trapping–detrapping events, recombination processes and gap-state parameters by modulated photocurrent measurements on amorphous silicon

Published:2014-05-15 Issue:21 Volume:94 Page:2447-2471
ISSN:1478-6435
Container-title:Philosophical Magazine
language:en
Short-container-title:Philosophical Magazine

Author:

Pomoni M.,Kounavis P.

Publisher

Informa UK Limited

Subject

Condensed Matter Physics

Link

http://www.tandfonline.com/doi/pdf/10.1080/14786435.2014.914262

Reference50 articles.

1. Transient photocapacitance and photocurrent studies of undoped hydrogenated amorphous silicon

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