Transient photocapacitance and photocurrent studies of undoped hydrogenated amorphous silicon
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.99892
Reference7 articles.
1. Measurement of the density of gap states in hydrogenated amorphous silicon by space charge spectroscopy
2. Disorder effects on deep trapping in amorphous semiconductors
3. Assessment of lattice relaxation effects in transitions from mobility gap states in hydrogenated amorphous silicon using transient photocapacitance techniques
4. Calculation of the dynamic response of Schottky barriers with a continuous distribution of gap states
5. Light-induced defect creation in hydrogenated amorphous silicon: A detailed examination using junction-capacitance methods
Cited by 52 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Photo-induced defects in MAPbBr3 single crystals;Journal of Physics: Energy;2021-09-30
2. Study of ion-implanted nitrogen related defects in diamond Schottky barrier diode by transient photocapacitance and photoluminescence spectroscopy;Japanese Journal of Applied Physics;2021-02-09
3. Device Characteristics of Hydrazine-Processed CZTSSe;Copper Zinc Tin Sulfide-Based Thin-Film Solar Cells;2015-01-30
4. In situ manipulation of the sub gap states in hydrogenated amorphous silicon monitored by advanced application of Fourier transform photocurrent spectroscopy;Solar Energy Materials and Solar Cells;2014-10
5. Optical response of deep defects as revealed by transient photocapacitance and photocurrent spectroscopy in CdTe/CdS solar cells;Solar Energy Materials and Solar Cells;2014-10
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3