Contact potential measurements with a local Kelvin probe-Reference-Cited by-同舟云学术

Contact potential measurements with a local Kelvin probe

Published:2002-07 Issue:11 Volume:82 Page:1257-1266
ISSN:1364-2812
Container-title:Philosophical Magazine B
language:en
Short-container-title:Philosophical Magazine B

Author:

Hadjadj A.¹²,Equer B.²,Beorchia A.¹,Cabarrocas P. Roca²

Affiliation:

1. a Dynamique des Transferts aux Interfaces (Unité Mixte de Recherche associée au CNRS 6107), Faculté des Sciences , Moulin de la Housse, BP 1039, 51687, Reims , Cedex , 2 , France

2. b Laboratoire de Physique des Interfaces et Couches Minces (Unité Mixte de Recherche associée au CNRS 7647) , Ecole Polytechnique, 91128, Palaiseau , Cedex , France

Publisher

Informa UK Limited

Subject

General Physics and Astronomy,General Chemical Engineering

Link

https://www.tandfonline.com/doi/pdf/10.1080/13642810208223162

Reference39 articles.

1. Multitip scanning bio-Kelvin probe

2. Analysis of stray capacitance in the Kelvin method

3. Surface States on Hydrogenated Amorphous Silicon

4. Kelvin probe microscopy measurements of surface potential change under wear at low loads

5. Imaging of a silicon pn junction under applied bias with scanning capacitance microscopy and Kelvin probe force microscopy

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