The study of grain boundary thickness using electron diffraction techniques-Reference-Cited by-同舟云学术

The study of grain boundary thickness using electron diffraction techniques

Published:1980-04 Issue:4 Volume:41 Page:467-475
ISSN:0141-8610
Container-title:Philosophical Magazine A
language:en
Short-container-title:Philosophical Magazine A

Author:

Carter C. B.,Donald A. M.,Sass S. L.

Publisher

Informa UK Limited

Subject

Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials

Link

http://www.tandfonline.com/doi/pdf/10.1080/01418618008239326

Reference12 articles.

1. The measurement of grain boundary thickness using X–ray diffraction techniques

2. Carter, C. B., Donald, A. M. and Sass, S. L. Proceedings of the Ninth International Congress on Electron Microscopy. Vol. 1, pp.420Microscopical Society of Canada.

3. Diffraction effects and images from inclined grain boundaries in polycrystalline thin foils

4. Carter, C. B., Föll, H., Ast, D. G. and Sass, S. L. Proceedings of the 37th Annual Meeting of EMSA. San Antonio. pp.686

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