The structure of moving grain boundaries in aluminium as revealed by synchrotron X-ray topography
Author:
Publisher
Informa UK Limited
Subject
Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials
Link
http://www.tandfonline.com/doi/pdf/10.1080/01418618408244229
Reference14 articles.
1. New possibilities for recrystallization study by X-Ray synchrotron radiation topography
2. Observation of the annealing twin growth by synchrotron radiation X-ray topography
3. Observation by synchrotron X-ray topography of faceting evolution of grain boundaries during recrystallization
4. 1984. (to be published)
5. Ultra-high vacuum heating camera forin situsynchrotron radiation X-ray topographic studies
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Development and Application of Synchrotron Radiation Dynamic Topography for Observation of Secondary Recrystallization Process;Tetsu-to-Hagane;1991
2. Materials Characterization by Synchrotron Radiations;Tetsu-to-Hagane;1991
3. Insight into the genesis of irregularity during crystal growth achieved monochromatic high sensitivity monochromatic synchrotron x-radiation diffraction imaging (topography);Progress in Crystal Growth and Characterization of Materials;1990-01
4. “In situ” determination of grain boundary migration rates by synchrotron white beam X-ray topography;Physica Status Solidi (a);1988-10-16
5. In situsynchrotron X-ray topography study of the generation of lattice dislocations in aluminium by migrating grain boundaries;Philosophical Magazine A;1988-06
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