Observation by synchrotron X-ray topography of faceting evolution of grain boundaries during recrystallization
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference14 articles.
1. Grain boundary faceting of 〈101̄0〉 tilt boundaries in zinc
2. Grain boundary kinking in f.c.c. bi-crystals
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4. Faceting of high-angle grain boundaries in the coincidence lattice
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1. Direct Observation of Grain Boundary Migration during Recrystallization within the Bulk of a Moderately Deformed Aluminium Single Crystal;MATERIALS TRANSACTIONS;2014
2. Adsorption, absorption, versus crystal growth;Crystal Research and Technology;2013-08-13
3. Insight into the genesis of irregularity during crystal growth achieved monochromatic high sensitivity monochromatic synchrotron x-radiation diffraction imaging (topography);Progress in Crystal Growth and Characterization of Materials;1990-01
4. “In situ” determination of grain boundary migration rates by synchrotron white beam X-ray topography;Physica Status Solidi (a);1988-10-16
5. In situsynchrotron X-ray topography study of the generation of lattice dislocations in aluminium by migrating grain boundaries;Philosophical Magazine A;1988-06
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