On the measurement of dislocation core distributions in a GaAs/ZnTe/CdTe heterostructure by high-resolution transmission electron microscopy-Reference-Cited by-同舟云学术

On the measurement of dislocation core distributions in a GaAs/ZnTe/CdTe heterostructure by high-resolution transmission electron microscopy

Published:2003-01 Issue:2 Volume:83 Page:231-244
ISSN:1478-6435
Container-title:Philosophical Magazine
language:en
Short-container-title:Philosophical Magazine

Author:

Kret Sławomir¹,Dłużewski Paweł²,Dłużewski Piotr¹,Laval Jean-Yves³

Affiliation:

1. a Institute of Physics , Polish Academy of Sciences , Al. Lotników 32/46, Warszawa , 02-668 , Poland

2. b Institute of Fundamental Technological Research , Polish Academy of Sciences , ul.Świętokrzyska 21, Warszawa , 02-049 , Poland

3. c Laboratoire de Physique du Solide, UPR 5 CNRS , Ecole Supérieure de Physique et Chimie Industrielles , 10 rue Vauquelin, Paris Cedex 05 , 75231 , France

Publisher

Informa UK Limited

Subject

Condensed Matter Physics

Link

https://www.tandfonline.com/doi/pdf/10.1080/0141861021000020095

Reference19 articles.

1. Quantitative analysis of the deformation and chemical profiles of strained multilayers

2. Direct measurement of local lattice distortions in strained layer structures by HREM

3. The role of the initial nucleation stage in microstructural development for CdTe grown on heat-cleaned 2°-off (001)GaAs by metalorganic chemical vapour deposition

4. On geometry and continuum thermodynamics of movement of structural defects

5. GAIROLA , B. K. D. 1979. “Dislocations in Solids”. Edited by: Nabarro , F. R. N. Vol. I, 223Amsterdam: North-Holland.

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