A model of dislocation blocking and its application to the development of misfit dislocation arrays
Author:
Publisher
Informa UK Limited
Subject
Metals and Alloys,Physics and Astronomy (miscellaneous),Condensed Matter Physics,General Materials Science,Electronic, Optical and Magnetic Materials
Link
http://www.tandfonline.com/doi/pdf/10.1080/01418610008212153
Reference13 articles.
1. Multiplication of misfit dislocations in epitaxial layers
2. Plastic relaxation and relaxed buffer layers for semiconductor epitaxy
3. Relaxation of strained‐layer semiconductor structures via plastic flow
4. A criterion for arrest of a threading dislocation in a strained epitaxial layer due to an interface misfit dislocation in its path
5. Striation development in CBE-grown vicinal plane InGaAs layers
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1. Evaluation of relaxation and misfit dislocation blocking in strained silicon on virtual substrates;Thin Solid Films;2008-11
2. Misfit dislocation arrays at the interface between La0.9Sr0.1MnO3films and vicinal SrTiO3(001) substrates;Philosophical Magazine Letters;2006-08
3. Formation of misfit dislocations in nanoscale Ni–Cu bilayer films;Philosophical Magazine;2004-03
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