A general accelerated life model for step-stress testing-Reference-Cited by-同舟云学术

A general accelerated life model for step-stress testing

Published:2005-11 Issue:11 Volume:37 Page:1059-1069
ISSN:0740-817X
Container-title:IIE Transactions
language:en
Short-container-title:IIE Transactions

Author:

Zhao Wenbiao,Elsayed Elsayed A.

Publisher

Informa UK Limited

Subject

Industrial and Manufacturing Engineering

Link

http://www.tandfonline.com/doi/pdf/10.1080/07408170500232396

Reference26 articles.

1. Optimum simple step-stress accelerated life-tests with competing causes of failure

2. Optimum simple step-stress accelerated life tests with censoring

3. Bhattacharyya, G. K. Parametric models and inference procedures for accelerated life tests. Presented as an invited paper for 46th session of the International Statistical Institute Meeting. September8-161986, Tokyo, Japan.

4. A tampered failure rate model for step-stress accelerated life test

5. Optimal Designs of Simple Step-Stress Accelerated Life Tests for Lognormal Lifetime Distributions

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