An effective and efficient defect inspection system for TFT-LCD polarised films using adaptive thresholds and shape-based image analyses-Reference-Cited by-同舟云学术

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An effective and efficient defect inspection system for TFT-LCD polarised films using adaptive thresholds and shape-based image analyses

Published:2009-08-21 Issue:17 Volume:48 Page:5115-5135
ISSN:0020-7543
Container-title:International Journal of Production Research
language:en
Short-container-title:International Journal of Production Research

Author:

Noh Chung-Ho¹,Lee Seok-Lyong¹,Kim Deok-Hwan²,Chung Chin-Wan³,Kim Sang-Hee⁴

Affiliation:

1. a School of Industrial and Management Engineering , Hankuk University of Foreign Studies , 89 Mohyun-myon, Yongin-shi, Korea

2. b School of Electronics Engineering , Inha University , Yonghyun-dong, Incheon-shi, Korea

3. c Division of Computer Science , KAIST , Daejeon-shi, Korea

4. d Key Technology Research Center , Agency for Defense Development , Daejeon-shi, Korea

Publisher

Informa UK Limited

Subject

Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management

Link

https://www.tandfonline.com/doi/pdf/10.1080/00207540903117899

Reference13 articles.

1. Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques

2. A shortest augmenting path algorithm for dense and sparse linear assignment problems

3. Detection of Spot-Type Defects on Liquid Crystal Display Modules

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