Fuzzy quality feature monitoring model
Author:
Affiliation:
1. a Department of Mechanical and Industrial Engineering , Ryerson University , Toronto, Canada
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Management Science and Operations Research,Strategy and Management
Link
https://www.tandfonline.com/doi/pdf/10.1080/00207540903117907
Reference17 articles.
1. SISO run-to-run feedback controller using triple EWMA smoothing for semiconductor manufacturing processes
2. Identification of change structure in statistical process control
3. Automated vision system for IC lead inspection
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