XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam-Reference-Cited by-同舟云学术

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XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam

Published:2016-06 Issue:2 Volume:11 Page:029603
ISSN:1934-8630
Container-title:Biointerphases
language:en
Short-container-title:Biointerphases

Author:

Dietrich Paul M.,Nietzold Carolin,Weise Matthias,Unger Wolfgang E. S.,Alnabulsi Saad,Moulder John

Funder

European Union - European Metrology Research Program

Publisher

American Vacuum Society

Subject

General Physics and Astronomy,General Biochemistry, Genetics and Molecular Biology,General Materials Science,Biomaterials,General Chemistry

Link

http://avs.scitation.org/doi/pdf/10.1116/1.4948341

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. XPS depth profiling of functional materials: applications of ion beam etching techniques;Materials Chemistry Frontiers;2024

2. Investigation of microstructure and corrosion behavior of weathering steel in aqueous solution containing different anions for simulating service environments;Corrosion Science;2020-07

3. Novel Silicon Titanium Diboride Micropatterned Substrates for Cellular Patterning;Biomaterials;2020-06

4. Engineering a Poly(3,4-ethylenedioxythiophene):(Polystyrene Sulfonate) Surface Using Self-Assembling Molecules—A Chemical Library Approach;ACS Omega;2018-04-02

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