Study of stability of MIS polycrystalline silicon solar cells by Auger electron spectroscopy-Reference-Cited by-同舟云学术

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Study of stability of MIS polycrystalline silicon solar cells by Auger electron spectroscopy

Published:1981-09 Issue:3 Volume:19 Page:696-699
ISSN:0022-5355
Container-title:Journal of Vacuum Science and Technology
language:en
Short-container-title:Journal of Vacuum Science and Technology

Author:

Lee B. W.,Kuo J. M.,Lalevic B.,Anderson W. A.

Publisher

American Vacuum Society

Subject

General Engineering

Link

http://avs.scitation.org/doi/pdf/10.1116/1.571088

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characterization of p‐Type Cadmium Telluride Obtained by Electrochemical Deposition;Journal of The Electrochemical Society;1986-12-01

2. Dependence of structural and compositional characteristics of chromium metal films as a function of deposition rate during the fabrication of metal/insulator/semiconductor solar cells;Thin Solid Films;1985-07

3. The effect of Be and Cr electrode deposition rate on the performance of MIS solar cells;Solar Cells;1985-07

4. A Scanning Auger Electron Spectroscopic Study of Particulate Defects in Metallurgical‐Grade Silicon;Journal of The Electrochemical Society;1984-01-01

5. Surface characterization;Analytical Chemistry;1983-04-01

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