Structural, morphological, FTIR and photoluminescence properties of gallium oxide thin films-Reference-Cited by-同舟云学术

Structural, morphological, FTIR and photoluminescence properties of gallium oxide thin films

Published:2014-05 Issue:3 Volume:32 Page:03D119
ISSN:2166-2746
Container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
language:en
Short-container-title:Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena

Author:

Cheng Yi,Chen Jixiang,Yang Kun,Wang Yizhuo,Yin Yan,Liang Hongwei,Du Guotong

Funder

NNSFC

Publisher

American Vacuum Society

Subject

Materials Chemistry,Electrical and Electronic Engineering,Surfaces, Coatings and Films,Process Chemistry and Technology,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://avs.scitation.org/doi/pdf/10.1116/1.4868523

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