Atomic flux measurement by diode-laser-based atomic absorption spectroscopy-Reference-Cited by-同舟云学术

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Atomic flux measurement by diode-laser-based atomic absorption spectroscopy

Published:1999-09 Issue:5 Volume:17 Page:2676-2684
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Wang Weizhi,Hammond R. H.,Fejer M. M.,Beasley M. R.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.581929

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improved control of atomic layering in perovskite-related homologous series;APL Materials;2021-02-01

2. Recent progress in thin-film growth of Fe-based superconductors: superior superconductivity achieved by thin films;Superconductor Science and Technology;2018-07-27

3. Adsorption-controlled growth of La-doped BaSnO3 by molecular-beam epitaxy;APL Materials;2017-11

4. Precision atomic beam density characterization by diode laser absorption spectroscopy;Review of Scientific Instruments;2016-09

5. Perspective: Oxide molecular-beam epitaxy rocks!;APL Materials;2015-06

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