Affiliation:
1. Department of Bioengineering, NESAC/BIO, University of Washington , Seattle, Washington 98195
Abstract
This is the second half of a two-part Tutorial on the basics of the time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of bio-related samples. Part I of this Tutorial series covers planning for a ToF-SIMS experiment, preparing and shipping samples, and collecting ToF-SIMS data. This Tutorial aims at helping the ToF-SIMS user to process, display, and interpret ToF-SIMS data. ToF-SIMS provides detailed chemical information about surfaces but comes with a steep learning. The purpose of this Tutorial is to provide the reader with a solid foundation in the ToF-SIMS data analysis.
Funder
National Institute of Biomedical Imaging and Bioengineering
Subject
General Physics and Astronomy,General Biochemistry, Genetics and Molecular Biology,General Materials Science,Biomaterials,General Chemistry
Cited by
4 articles.
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