Tunnel current controlled atomic force microscope designs-Reference-Cited by-同舟云学术

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Tunnel current controlled atomic force microscope designs

Published:1993-07 Issue:4 Volume:11 Page:768-772
ISSN:0734-2101
Container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
language:en
Short-container-title:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films

Author:

Kim H. S.,Bryant P. J.

Publisher

American Vacuum Society

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Link

http://avs.scitation.org/doi/pdf/10.1116/1.578345

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Experimental confirmation of the atomic force microscope cantilever stiffness tilt correction;Review of Scientific Instruments;2017-12

2. Cantilever calibration for nanofriction experiments with atomic force microscope;Applied Physics Letters;2005-04-18

3. Quantitative nanotribology by atomic force microscopy;Journal of Physics D: Applied Physics;2005-03-04

4. Dynamic-Contact Electrostatic Force Microscopy and its Application to Ferroelectric Domain;Nanoscale Phenomena in Ferroelectric Thin Films;2004

5. A method for determining the spring constant of cantilevers for atomic force microscopy;Measurement Science and Technology;1996-02-01

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